You have checked microchips of different sizes. Does the quality of the inspection play a role in the size?
Becker: The constant progress in the semiconductor industry is leading to ever smaller and at the same time more efficient technologies. This means that more functions can be accommodated in the same space, and the operation of these chips is also more energy-efficient. In order to be able to make realistic estimates regarding Trojan detection, we have ventured into technology sizes from 90nm down to 28nm, which are also currently offered by contract manufacturers. Of course, the resolution or image quality of individual logic components deteriorates as technology sizes shrink, making it more difficult to detect subtle changes. You could then buy a new, better scanning electron microscope, but that is a multi-million dollar investment.
What was your hit rate on the examination?
Becker: We were able to achieve very good results here with our method. Across all technology sizes, we were able to detect all newly added logic devices - the most likely scenario in a Trojan injection. We were also able to achieve very good results with the replaced logic components and identify them completely for the three larger chips, tolerating a few dozen false-positive hits - these could quickly be sorted out manually. However, for the smallest chip, we missed three out of six extremely small changes. Better image processing algorithms based on artificial intelligence, for example, or imaging with a more advanced scanning electron microscope could remedy this.
At what point in the manufacturing process could your method be used?
Becker: Our method could be used by a specialized analysis company that has been commissioned by the chip design house and is then provided with samples of the finished chips as well as the necessary parts of the construction plans. Since the procedure is relatively complex and expensive, it is only worthwhile if there is already a concrete suspicion.
Do you see the possibility of industrializing the process of checking chips for Trojans so that it becomes part of a standard manufacturing chain?
Becker: In addition to the effort just mentioned, the method we use has a decisive disadvantage, which is why it cannot be used on an industrial scale: It is destructive, which means that the chip under investigation can no longer be used afterwards. It can therefore only ever be used to detect Trojans, but it cannot be used to obtain chips that are guaranteed to be Trojan-free - even though this could be ruled out with a high degree of probability by checking a few randomly selected chips from a production batch.
In the future, however, research could remedy this situation: On the one hand, through imaging methods similar to X-rays that do not result in the destruction of the chip - there have already been initial successes here with the synchrotron. On the other hand, there are also detection approaches that are based, for example, on observing the input/output behavior of the chips - but these can never be as accurate as detection with the aid of imaging processes. More transparency in the manufacturing chain could also help to detect unintentional changes more easily - this will also depend on the regulatory authorities in the future.
You make your research data freely available to other users. Why?
Becker: This transparency is important so that others can understand our experiments and also improve them. Especially in the semiconductor world, there is often a lack of practical and publicly available examples. That is why we decided to make our image datasets and algorithms available to the scientific community and beyond.